Lead Metrology Engineer: FIB/SEM, AFM & AI

Micron Technology, Inc. is seeking a senior metrology expert to lead development and deployment of advanced metrology for 3D NAND process development, focusing on Focused Ion Beam (FIB) and complementary techniques. You will collaborate across process, yield, and manufacturing teams to translate measurement insights into improved yield and reliability. This role emphasizes building roadmaps with suppliers, evaluating new FOAK systems, and applying AI/ML to metrology data to diagnose electrical …